- probe contact
- зондовый контакт
The New English-Russian Dictionary of Radio-electronics. F.V Lisovsky . 2005.
probe contact
Смотреть что такое "probe contact" в других словарях:
probe contact pad — zondo kontakto aikštelė statusas T sritis radioelektronika atitikmenys: angl. probe contact pad vok. Kontaktstelle für Sondenprüfung, f rus. контактная площадка для зонда, f pranc. plot de soudure pour sonde, m … Radioelektronikos terminų žodynas
Probe card — A probe card is an interface between an electronic test system and a semiconductor wafer. Its purpose is to provide an electrical path between the test system and the circuits on the wafer, thereby permitting the testing and validation of the… … Wikipedia
Contact resistance — The term contact resistance refers to the contribution to the total resistance of a material which comes from the electrical leads and connections as opposed to the intrinsic resistance, which is an inherent property, independent of the… … Wikipedia
Contact binary (asteroid) — In the study of asteroids, a contact binary is caused when two asteroids gravitate toward each other until they touch, forming an oddly shaped single body. Asteroids suspected of being contact binaries include the unusually elongated 624 Hektor… … Wikipedia
Contact pad — Gold wire ball bonded to a gold contact pad Contact pads are designated surface areas of a printed circuit board or die of an integrated circuit. Possibilities to contact to pads include soldering, wirebonding, Flip chip mounting, or probe… … Wikipedia
probe — I. noun Etymology: Medieval Latin proba examination, from Latin probare Date: 1580 1. a slender medical instrument used especially for exploration (as of a wound or body cavity) 2. a. any of various testing devices or substances: as (1) a pointed … New Collegiate Dictionary
Non-contact wafer testing — Wafer testing is a normal step in semiconductor device fabrication, used to detect defects in integrated circuits (IC) before they are assembled during the IC packaging step. Traditional (contact) wafer testing Probing ICs while they are still on … Wikipedia
Test probe — Typical passive oscilloscope probe being used for testing an integrated circuit. A test probe (test lead, test prod, or scope probe) is a physical device used to connect electronic test equipment to the device under test (DUT). They range from… … Wikipedia
Mercury probe — The Mercury Probe is an electrical probing device to make rapid, non destructive contact to a sample for electrical characterization. Its primary application is semiconductor measurements where time consuming metallizations or photolithographic… … Wikipedia
Scanning probe microscopy — Part of a series of articles on Nanotechnology … Wikipedia
Kelvin probe force microscope — Kelvin probe force microscopy ( KPFM ), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM) that was [http://dns.ntu ccms.ntu.edu.tw/references/APPL PHYS LETT 58 2921 1991.pdf invented] in 1991.… … Wikipedia
